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SD-TSIA210--Telecom-Paris

Statistical learning is concerned with model inference for pattern recognition, prediction and diagnosis, within a probabilistic and statistical framework.

In this course, students will learn

  • to pose a supervised learning problem (classification and regression) by formulating it as a statistical criteria optimization problem,
  • develop an appropriate learning algorithm
  • and evaluate the resulting classification or regression function. The main supervised learning models and algorithms (e.g. perceptron, SVM/SVR, tree, ensemble methods) will be studied, along with a few generative approaches. A short introduction to unsupervised learning will also be given.

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Statistical learning for pattern recognition

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