Releases: AdvancedPhotonSource/ptychodus
Releases · AdvancedPhotonSource/ptychodus
v0.7.7
v0.7.6: Ptycho+XRF Demo (#101)
- Added file readers for LCLS XPP instrument
- Implemented VSPI algorithm for ptycho-enhanced XRF
- Added BDP hooks for ptycho-enhanced XRF
- Extracted reconstructor API
- Added APS S31 batch reconstruction workflow
- Added Ptychoshelves product file reader
- Implemented fix needed to support numpy 2.0
- Added workflow to auto-load product files as they appear
- Cleaned up timers
- Fixed crash when selecting zero-sized region with rectangle tool
- Refactored settings classes to use parametric classes
- Refactor Tike GUI to use parametric view controllers
- Enable syncing product/scan/probe/object parameters to settings
- Make default product name configurable and validate renaming
- Implemented requested GUI change: Start on diffraction patterns view
- Implemented requested GUI change: Renamed HDF5 diffraction file reader
- Implemented requested GUI change: Prompt user to choose diffraction file format
- Reformatted repository using ruff format
v0.7.5
- Update PtychoNN integration to 0.3.x API
- Set default logging level to INFO
- Prototype STXM simulator and probe propagation dialog
- Add defocus distance to disk and rect probe builders
- Fix nanomax scan reader
v0.7.4
- fixes to ptychodus_bdp based on feedback
v0.7.3
- Add reconstruction data prep utility to facilitate beamline data pipeline integration
v0.7.2
- stage reconstruction inputs to directory
- add exposure time metadata
- prototype analysis dialogs
v0.7.1
What's Changed
- BUG: Correct coordinate transform between tike and ptychodus by @carterbox in #81
Full Changelog: v0.7.0...v0.7.1
v0.7.0
- Introduced data products to group metadata, scan, probe, and object
- Exposed automation capability: api, plugins, view
- Refactored visualization module to support multiple views; added histogram view for rectangle tool
- Cleaned up object patch extraction & stitching methods
- Introduced parametric API to reduce boilerplate code needed for simple model parameters
- Preset zone plate parameters made available via plugin system
- Add single DFT Fresnel wave propagator
- Removed monitor view
- Removed RPC module
- Prototype probe propagation analysis capability
- Prototype dichroic ptychography analysis capability
- Parent items in patterns tree view now display mean rather than sum of child patterns
- Added rectangular, Zernike, and average diffraction pattern probe builders
- Added metadata for product name, comments, and probe photon flux
- Added triangular and equilateral Cartesian scan builders
- Support applying affine scan transformations
- Added logo
v0.6.8
What's Changed
- NEW: Add update magnitude limit parameter to Position Options by @carterbox in #77
Full Changelog: v0.6.7...v0.6.8
v0.6.7
What's Changed
- API: Invert each scan axes for LYNX dataloaders by @carterbox in #73
Full Changelog: v0.6.6...v0.6.7