From 90ad6b203072dd1b0fcf9ab08b5785bb154ef547 Mon Sep 17 00:00:00 2001 From: Sean MacBride Date: Fri, 13 Dec 2024 11:24:46 -0500 Subject: [PATCH] Fix filename error --- sections/baselineCharacterization.rst | 4 ++-- 1 file changed, 2 insertions(+), 2 deletions(-) diff --git a/sections/baselineCharacterization.rst b/sections/baselineCharacterization.rst index 8c7f490..dc9405f 100644 --- a/sections/baselineCharacterization.rst +++ b/sections/baselineCharacterization.rst @@ -88,8 +88,8 @@ In the context of LSSTCam, we extract bright pixels from the dark current, with Reviewing the differences in bright pixels, we find consistent bright defect counts between Run 6 and Run 7. There appears to be a small excess of bright defects in Run 7. -.. image:: /figures/baselineCharacterization/13557_E1071_BRIGHT_PIXELS_diff.png - :target: /figures/baselineCharacterization/13557_E1071_BRIGHT_PIXELS_diff.png +.. image:: /figures/baselineCharacterization/BRIGHT_PIXELS_13557_E1071_diff.png + :target: /figures/baselineCharacterization/BRIGHT_PIXELS_13557_E1071_diff.png :alt: The comparison between bright pixel measurements at SLAC and at Cerro Pachon, taking the differences between measurements on a per amp basis. Taking the difference of defect counts on each amplifier, and separating the amplifiers by the detector manufacturer shows a small excess of bright defects in run 7 when compared to run 6. For ITL sensors, we find 12% of the amplifiers with more bright pixels than run 6. For E2V sensors, we find 4% of the amplifiers with more bright pixels than run 6. Despite this, the number of bright defects between runs does not increase for most sensors.